64 Gbps Dual DP3T RF MEMS Relay
MM5620
The MM5620 is a specialized relay that supports fast and high-quality signal switching for advanced technology standards such as PCIe Gen 5, Gen 6, and SerDes. Its Ideal Switch® technology from Menlo Micro allows it to operate at high speeds of up to 64 Gbps or 20 GHz, while also maintaining low insertion loss and a fast switching speed for reliable performance.
Additionally, the MM5620 can handle over 3 billion switching cycles and comes in a compact system-in-package (SiP) solution that includes a switch driver and charge pump controlled through SPI or GPIO interfaces by a host processor. This integration also includes loopback capacitors, which helps to reduce the overall board footprint for high-volume production test solutions.
As a result, the MM5620 switch provides high data rate and high-speed differential data applications, making it an ideal solution for space-constrained final test and probe test for a variety of products, including smart phones, graphics and network processors, microprocessors, accelerators, and high-speed memory products.
Bright Toward serves as Menlo Micro's technical support and distributor in Asia. Please contact us for more information.
Features
- Ideal Switch® Technology provided by Menlo Micro
- DC to 20 GHz range, up to 64 Gbps
- Differential, Dual DP3T
- Optimized for PCIe Gen 5 & 6, SerDes
- Insertion Loss 1.5dB @ 16GHz De-embed (Differential)
- High reliability >3B switching cycles
- Built-in AC coupling capacitors
- SPI and GPIO interface
- 8.2 mm x 8.2 mm LGA
Contact Form
- Differential, Dual DP3T (*For more details, please see the below diagram.)
Frequency
- DC to 20 GHz range
- 64 Gbps
On Resistance (Ω)
- 1.7
Insertion Loss
- 1.5dB @16GHz (Differential)
Return Loss
- 28dB @16GHz (High Speed)
Isolation
- 67dB @16GHz (High Speed)
ESD Protection
- 150V
*The communication interface: GPIO and SPI
*VDD_IO: Digital I/O supply (+1.8V to +5.0V)
*VDD: +3.3V supply to analog circuits
*VIN: +5V supply to the internal charge pump
*Test Two PCIe 4/5/6 lanes at high speed using ONE MM5620 device
- TX0_X ↔ RX0_X (HS1 ↔ HS2) at speed test
- TX1_X ↔ RX1_X (MS1 ↔ MS2) at speed test
*LS signals can be shared for low frequency and DC sweep test
*Two transmitters can be ALWAYS ON to reduce test time
*Fully bi-directional signal paths
MM5620: Signal Paths and Measurement Cases
High Speed 1(HS1 ↔ HS2)、High Speed 2(MS1 ↔ MS2)、Low Speed (LS1 ↔ LS2)
MM5620 S-Parameter Performance (HS1 to HS2 Signal Path)
Eye-Diagram Test Conditions: PCIe Gen6 / PAM4, 32 Gbaud(64Gbps), PRBS 2^15-1 / ±400mV
MM5620 S-Parameter Performance (MS1 to MS2 Signal Path)
Eye-Diagram Test Conditions: PCIe Gen6 / PAM4, 32 Gbaud(64Gbps), PRBS 2^15-1 / ±400mV
MM5620: Signal Paths and Measurement Cases
HS1 ↔ MS1、HS2 ↔ MS2、HS1 ↔ LS1、HS2 ↔ LS2、MS1 ↔ LS1、MS2 ↔ LS2
Application
- High-Speed Data Digital Component Testing
- Optical-Electrical Module Testing
- High-Speed Signal Routing
- ATE Device Interface Boards
- Optical-Electrical Module Testing
- Differential Switch Matrices
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